| 7-1 Insulation Resistance (Unmated) | Between adjacent contacts and contacts to shell. Apply 100 Volts DC. | EIA 364-21C | 100M minimum |
| 7-2 Low Level Contact Resistance | Initial for VBUS and GND contacts; all other contacts. 100mA max., 20mV max. open circuit. | EIA 364-23b | 40m (Max) initial; delta 10m (Max) after test |
| 7-3 Dielectric Withstanding Voltage | Between adjacent terminals. Subjected to 100VAC (RMS) for 1 minute. | EIA 364-20 | No breakdown |
| 7-4 Contact Current Rating | Current applied collectively to VBUS pins, VCONN pin, and other contacts. Temperature rise not to exceed 30 C. | EIA364-70 | VBUS: 5.0A; VCONN: 1.25A; Others: 0.25A |
| 6-1 Durability | Cycle test for USB Type-C connectors. | EIA 364-09 | 10000 cycles (200 cycles/hour rate) |
| 6-2 Cable Flexing | 100 cycles in each of 2 planes at 120 degrees. Dimension x = 3.7 x cable diameter. | EIA 364-41 | No discontinuity over 1 microsecond |
| 6-3 Cable Pull-Out | 40N steady state axial load for 1 minute. | EIA-364-38 | No discontinuity or physical damage |
| 6-4 4-axes continuity test | 8N tensile force for 10 seconds in 0, 90, 180, 270 directions. | EIA364-18 | No discontinuity > 1s and no physical damage |
| 8-1 Temperature Life | 105 C without applied voltage for 120 hours. Preconditioning for 72 hours. | EIA 364-17 | Visual inspection, test sequences per EIA 364-1000.01 |
| 8-2 Thermal Shock | 10 Cycles -55C and +85C. Mated connectors. | EIA 364-32 | No evidence of physical damage |
| 8-3 Salt Spray | 48 hours at 35C with 5% Salt-solution concentration. Mated connectors. | MIL-STD-202F, Method 101D, Test Condition B | Meet visual and additional test requirements |
| 8-4 Humidity | 25C 3C @ 80% RH to 65C 3C @ 50% RH. | EIA 364-31 | 0.5 /N (Max) for signal pins, 2.5 /N (Max) for power pins |
